Kees van Kaam
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2001–2005
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2005 | ITC | Test and debug features of the RTO7 chip. | Kees van Kaam, Bart Vermeulen, Henk Jan Bergveld |
| 2001 | ITC | The future of delta I_DDQ testing. | Bram Kruseman, Rudger van Veen, Kees van Kaam |