Kees Veelenturf
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
1998–2000
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | DATE | The Road to Better Reliability and Yield Embedded DfM Tools. | Kees Veelenturf |
| 2000 | DATE | Tutorial Statement. | Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf |
| 1998 | ITC | Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. | Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen |