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Keith A. Bowman

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

16

Venues

6

Active years

2000–2014

Best venue rank

A*

Where they publish

Papers

16 indexed papers, newest first.

YearVenueTitleAuthors
2014ITCTrading-off on-die observability for cache minimum supply voltage reduction in system-on-chip (SoC) processors.Keith A. Bowman, Alex Park, Venkat Narayanan, Francois Atallah, Alain Artieri, Sei Seung Yoon, Kendrick Yuen, David Hansquine
2013ISLPEDMinimum supply voltage for sequential logic circuits in a 22nm technology.Chia-Hsiang Chen, Keith A. Bowman, Charles Augustine, Zhengya Zhang, Jim Tschanz
2012ASPDACRobust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues.Vijay Janapa Reddi, David Z. Pan, Sani R. Nassif, Keith A. Bowman
2012DATEDesign for test and reliability in ultimate CMOS.Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep P. Kulkarni, Vivek De, Dimiter Avresky
2010ASPDACResilient design in scaled CMOS for energy efficiency.James W. Tschanz, Keith A. Bowman, Muhammad M. Khellah, Chris Wilkerson, Bibiche M. Geuskens, Dinesh Somasekhar, Arijit Raychowdhury, Jaydeep P. Kulkarni, Carlos Tokunaga, Shih-Lien Lu, Tanay Karnik, Vivek De
2010ICCADResilient microprocessor design for improving performance and energy efficiency.Keith A. Bowman, James W. Tschanz
2010ISLPEDResilient microprocessor design for high performance & energy efficiency.Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Paolo A. Aseron, Muhammad M. Khellah, Arijit Raychowdhury, Bibiche M. Geuskens, Carlos Tokunaga, Chris Wilkerson, Tanay Karnik, Vivek De
2009DACCircuit techniques for dynamic variation tolerance.Keith A. Bowman, James W. Tschanz, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik, Vivek De, Shekhar Y. Borkar
2009ICCADResilient circuits - Enabling energy-efficient performance and reliability.James W. Tschanz, Keith A. Bowman, Chris Wilkerson, Shih-Lien Lu, Tanay Karnik
2007DACComparative Analysis of Conventional and Statistical Design Techniques.Steven M. Burns, Mahesh Ketkar, Noel Menezes, Keith A. Bowman, James W. Tschanz, Vivek De
2007ISLPEDImpact of die-to-die and within-die parameter variations on the throughput distribution of multi-core processors.Keith A. Bowman, Alaa R. Alameldeen, Srikanth T. Srinivasan, Chris Wilkerson
2006ISLPEDTime-borrowing multi-cycle on-chip interconnects for delay variation tolerance.Keith A. Bowman, James W. Tschanz, Muhammad M. Khellah, Maged Ghoneima, Yehea I. Ismail, Vivek De
2005DACVariation-tolerant circuits: circuit solutions and techniques.James W. Tschanz, Keith A. Bowman, Vivek De
2005ICCADTotal power-optimal pipelining and parallel processing under process variations in nanometer technology.Peter Suaris, Taeho Kgil, Keith A. Bowman, Vivek De, Trevor N. Mudge
2005ISLPEDMeasurements and modeling of intrinsic fluctuations in MOSFET threshold voltage.Ali Keshavarzi, Gerhard Schrom, Stephen Tang, Sean Ma, Keith A. Bowman, Sunit Tyagi, Kevin Zhang, Tom Linton, Nagib Hakim, Steven G. Duvall, John Brews, Vivek De
2000ISLPEDMinimum power and area n-tier multilevel interconnect architectures using optimal repeater insertion.Raguraman Venkatesan, Jeffrey A. Davis, Keith A. Bowman, James D. Meindl