Keith Baker
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
21
Venues
4
Active years
1984–2004
Best venue rank
A*
Where they publish
Papers
21 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | HPDC | The Grid2003 Production Grid: Principles and Practice. | Ian T. Foster, Jerry Gieraltowski, Scott Gose, Natalia Maltsev, Edward N. May, Alex A. Rodriguez, Dinanath Sulakhe, A. Vaniachine, Jim Shank, Saul Youssef, David Adams, Richard Baker, Wensheng Deng, Jason Smith, Dantong Yu, Iosif Legrand, Suresh Singh, Conrad Steenberg, Yang Xia, M. Anzar Afaq, Eileen Berman, James Annis, L. A. T. Bauerdick, Michael Ernst, Ian Fisk, Lisa Giacchetti, Gregory E. Graham, Anne Heavey, Joseph Kaiser, Nickolai Kuropatkin, Ruth Pordes, Vijay Sekhri, John Weigand, Yujun Wu, Keith Baker, Lawrence Sorrillo, John Huth, Matthew Allen, Leigh Grundhoefer, John Hicks, Fred Luehring, Steve Peck, Robert Quick, Stephen C. Simms, George Fekete, Jan vandenBerg, Kihyeon Cho, Kihwan Kwon, Dongchul Son, Hyoungwoo Park, Shane Canon, Keith R. Jackson, David E. Konerding, Jason Lee, Doug Olson, Iwona Sakrejda, Brian Tierney, Mark Green, Russ Miller, James Letts, Terrence Martin, David Bury, Catalin Dumitrescu, Daniel Engh, Robert W. Gardner, Marco Mambelli, Yuri Smirnov, Jens-S. Vckler, Michael Wilde, Yong Zhao, Xin Zhao, Paul Avery, Richard Cavanaugh, Bockjoo Kim, Craig Prescott, Jorge Luis Rodriguez, Andrew Zahn, Shawn McKee, Christopher T. Jordan, James E. Prewett, Timothy L. Thomas, Horst Severini, Ben Clifford, Ewa Deelman, Larry Flon, Carl Kesselman, Gaurang Mehta, Nosa Olomu, Karan Vahi, Kaushik De, Patrick McGuigan, Mark Sosebee, Dan Bradley, Peter Couvares, Alan DeSmet, Carey Kireyev, Erik Paulson, Alain Roy, Scott Koranda, Brian Moe, Bobby Brown, Paul Sheldon |
| 2000 | ITC | Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? | Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg |
| 1999 | ITC | SIA Roadmaps: Sunset Boulevard for l_DDQ. | Keith Baker |
| 1998 | ITC | Spice up your life: simulate mixed-signal ICs! | Keith Baker |
| 1996 | DATE | IDDQ: you heard the hype, but what's really coming? | Keith Baker |
| 1996 | ITC | Shmoo Plots - the Black Art of IC Test. | Keith Baker, Jos van Beers |
| 1995 | ITC | Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say? | Keith Baker |
| 1995 | ITC | Plug & Play I | Keith Baker, T. F. Waayers, F. G. M. Bouwman, M. J. W. Verstraelen |
| 1994 | ITC | QTAG: A Standard for Test Fixture Based I | Keith Baker |
| 1994 | ITC | Development of a CLASS 1 QTAG Monitor. | Keith Baker, A. H. Bratt, Andrew Richardson, A. Welbers |
| 1994 | ITC | Application of Joint Time-Frequency Analysis in Mixed-Signal Testing. | Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, Jan Koopmans |
| 1994 | ITC | Analogue Fault Simulation Based on Layout-Dependent Fault Models. | R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker |
| 1993 | ITC | Parameter Monitoring: Advantages and Pitfalls. | M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess |
| 1992 | ITC | Time-to-Market: An Issue in Mixed-signal vs. Analogue. | Keith Baker |
| 1992 | ITC | Improving Total IC Design Quality Using Application Mode Testing. | R. Mehtani, M. De Jonghe, Richard Morren, Keith Baker |
| 1992 | ITC | Using EDIF for Transfer of Test Data: Practical Experience. | Bas Verhelst, Richard Morren, Keith Baker |
| 1990 | ITC | I | Keith Baker, Bas Verhelst |
| 1990 | ITC | Macro-testability and the VSP. | R. Mehtani, Keith Baker, C. M. Huizer, P. J. Hynes, Jos van Beers |
| 1987 | DAC | A Fast Signature Simulation Tool for Built-In Self-Testing Circuits. | S. B. Tan, K. Totton, Keith Baker, Prab Varma, R. Porter |
| 1986 | ITC | An Intelligent Knowledge-Based System Tool for High-Level BIST Design. | N. A. Jones, Keith Baker |
| 1984 | ITC | An Analysis of the Economics of Self Test. | Prab Varma, Anthony P. Ambler, Keith Baker |