| 2012 | ITC | Capacitive sensing testability in complex memory devices. | Kenneth P. Parker |
| 2011 | ITC | Surviving state disruptions caused by test: A case study. | Kenneth P. Parker, Shuichi Kameyama, David Dubberke |
| 2010 | ITC | Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. | C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill |
| 2010 | ITC | Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. | Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird |
| 2010 | ITC | Surviving state disruptions caused by test: The "Lobotomy Problem". | Kenneth P. Parker |
| 2009 | ITC | An outlier detection based approach for PCB testing. | Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird |
| 2009 | ITC | What is IEEE P1149.8.1 and why? | Kenneth P. Parker, Jeff Burgess |
| 2009 | ITC | Testing bridges to nowhere - combining Boundary Scan and capacitive sensing. | Steve Sunter, Kenneth P. Parker |
| 2008 | ITC | Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. | Dayton Norrgard, Kenneth P. Parker |
| 2008 | ITC | Boundary-Scan Testing of Power/Ground Pins. | Kenneth P. Parker, Neil G. Jacobson |
| 2007 | ITC | A bead probe CAD strategy for in-circuit test. | Kenneth P. Parker, Don DeMille |
| 2007 | ITC | Finding power/ground defects on connectors - a new approach. | Kenneth P. Parker, Stephen Hird |
| 2005 | ITC | The effects of defects on high-speed boards. | Kenneth P. Parker |
| 2005 | ITC | Bead probes in practice. | Kenneth P. Parker |
| 2005 | ITC | A new probing technique for high-speed/high-density printed circuit boards. | Kenneth P. Parker |
| 2004 | ITC | A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. | Kenneth P. Parker |
| 2004 | ITC | Board Test Coverage Needs to be Standardized. | Kenneth P. Parker |
| 2003 | ITC | Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? | Kenneth P. Parker |
| 2002 | ITC | IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. | Bill Eklow, Carl Barnhart, Kenneth P. Parker |
| 2002 | ITC | Test Coverage: What Does It Mean When a Board Test Passes?. | Kathy Hird, Kenneth P. Parker, Bill Follis |
| 2002 | ITC | Board Test Is NOT Mature. | Kenneth P. Parker |
| 2001 | ITC | Frequency detection-based boundary-scan testing of AC coupled nets. | Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick |
| 2000 | ITC | System issues in boundary-scan board test. | Kenneth P. Parker |
| 1997 | ITC | Design, Fabrications and Use of Mixed-Signal IC Testability Structures. | Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa |
| 1996 | ITC | Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. | Kenneth P. Parker |
| 1996 | ITC | Opens Board Test Coverage: When is 99% Really 40%? | Mick Tegethoff, Kenneth P. Parker, Ken Lee |
| 1995 | ITC | The ITC Lecture Series: An Experiment. | Kenneth P. Parker, David Greene |
| 1994 | ITC | Observations on the 1149.x Family of Standards. | Kenneth P. Parker |
| 1993 | ITC | Structure and Metrology for an Analog Testability Bus. | Kenneth P. Parker, John E. McDermid, Stig Oresjo |
| 1990 | ITC | A language for describing boundary-scan devices. | Kenneth P. Parker, Stig Oresjo |