Koen Matthijs
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2016–2016
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ITC | Analog fault coverage improvement using final-test dynamic part average testing. | Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen |