Krishna B. Rajan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1992–1996
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1996 | VTS | Increasing testability by clock transformation (getting rid of those darn states). | Krishna B. Rajan, David E. Long, Miron Abramovici |
| 1992 | DAC | Freeze!: A New Approach for Testing Sequential Circuits. | Miron Abramovici, Krishna B. Rajan, David T. Miller |