Krunal Maniar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2013–2013
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2013 | ITC | Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. | Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi |