Liang-Yen Chen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2019–2019
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2019 | ITC | High Quality Test Methodology for Highly Reliable Devices. | Hao Chen, Mincent Lee, Liang-Yen Chen, Min-Jer Wang |