Loek Thijssen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
1
Active years
1988–1993
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1993 | ITC | Minimizing Test Time by Exploiting Parallelism in Macro Test. | Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker |
| 1990 | ITC | Functional and I | R. Meershoek, Bas Verhelst, Rory McInerney, Loek Thijssen |
| 1988 | ITC | Fault Modeling and Test Algorithm Development. | Frans P. M. Beenker, Rob Dekker, Loek Thijssen |
| 1988 | ITC | A Realistic Self-Test Machine for Static Random Access Memories. | Frans P. M. Beenker, Rob Dekker, Loek Thijssen |