Lutz Gendrisch
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2017–2017
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | IOLTS | Automating wafer-level test of uncooled infrared detectors using wafer-prober. | Mohamed Makhlouf, Diana Goller, Lutz Gendrisch, Stephan Kolnsberg, Franz Vogt, Alexander Utz, Dirk Weiler, Holger Vogt |