M. Hyozo
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1990–1990
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1990 | ITC | A fine pitch probe technology for VLSI wafer testing. | T. Tada, R. Takagi, S. Nakao, M. Hyozo, T. Arakawa, K. Sawada, M. Ueda |