M. K. Radhakrishnan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2003–2004
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | VLSID | Device Reliability and Failure Mechanisms Related to Gate Dielectrics and Interconnects. | M. K. Radhakrishnan |
| 2003 | VLSID | ESD Reliability Challenges for RF/Mixed Signal Design & Processing. | Natarajan Mahadeva Iyer, M. K. Radhakrishnan |