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M. Simes

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

2

Active years

1995–1995

Best venue rank

A

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
1995DATETest preparation methodology for high coverage of physical defects in CMOS digital ICs.Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira
1995VTSTest preparation for high coverage of physical defects in CMOS digital ICs.Marcelino B. Santos, M. Simes, Isabel C. Teixeira, Joo Paulo Teixeira