Maikel van Beurden
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2011–2011
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2011 | DATE | Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. | Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing |
| 2011 | ITC | Defect Oriented Testing for analog/mixed-signal devices. | Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing |