Mark Naivar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1994–1994
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1994 | VTS | Limitations in predicting defect level based on stuck-at fault coverage. | Jaehong Park, Mark Naivar, Rohit Kapur, M. Ray Mercer, Thomas W. Williams |