Masaki Kohno
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1999–2001
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | ITC | An evaluation of defect-oriented test: WELL-controlled low voltage test. | Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto |
| 1999 | ITC | Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. | Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani |