Masato Kawai
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
1981–1988
Best venue rank
A*
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1988 | ITC | System Level Fault Dictionary Generation. | Hidetoshi Tanaka, Masato Kawai, Izumi Sugasaki, Tadanobu Hakuba |
| 1986 | ITC | Test Data Quality Assurance. | Masato Kawai, T. Shimono, Shigehiro Funatsu |
| 1986 | ITC | Testing for a Solid-State Color Image Sensor. | T. Noguchi, Atsushi Murakami, Masato Kawai, Y. Hayasaka |
| 1985 | ITC | An AC/DC Test Generation System for Gate Array LSIs. | T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu |
| 1984 | DAC | An experimental MOS fault simulation program CSASIM. | Masato Kawai, John P. Hayes |
| 1983 | ITC | A High Level Test Pattern Generation Algorithm. | Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki |
| 1981 | ITC | A Calculus of Testability Measure at the Functional Level. | Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada |