Math Muris
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1990–1998
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | Testing a multichip package for a consumer communications application. | Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer |
| 1993 | ITC | Using Boundary Scan Test to Test Random Access Memory Clusters. | Math Muris, Alex S. Biewenga |
| 1990 | ITC | Integrating boundary scan test into an ASIC design flow. | Math Muris |