Matthias Tilmann
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2010–2010
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ITC | BIST of I/O circuit parameters via standard boundary scan. | Stephen K. Sunter, Matthias Tilmann |