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Mauro Ciappa

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

1

Active years

2009–2010

Best venue rank

B

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
2010ETSNovel built-in methodology for defect testing of capacitor oxide in SAR analog to digital converters for critical automotive applications.Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner
2009ETSNovel Solution for the Built-in Gate Oxide Stress Test of LDMOS in Integrated Circuits for Automotive Applications.Vezio Malandruccolo, Mauro Ciappa, Wolfgang Fichtner, Hubert Rothleitner