Mehul D. Shroff
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2016–2024
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2024 | ITC | A Fast, Statistical, Machine-learning Approach for Automotive Semiconductor Test Reduction. | Mehul D. Shroff, Nguyen Nguyen, Kiran Sunny Thota |
| 2016 | ICCAD | Voltage-based electromigration immortality check for general multi-branch interconnects. | Zeyu Sun, Ertugrul Demircan, Mehul D. Shroff, Taeyoung Kim, Xin Huang, Sheldon X.-D. Tan |