Michael M. Y. Hui
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1992–1992
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1992 | VTS | Scan testing of latch arrays. | Michael M. Y. Hui, Benoit Nadeau-Dostie |