Michal Rakowski
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2007–2008
Best venue rank
C
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | DSD | Hierarchical Analysis of Short Defects between Metal Lines in CMOS IC. | Witold A. Pleskacz, Maksim Jenihhin, Jaan Raik, Michal Rakowski, Raimund Ubar, Wieslaw Kuzmicz |
| 2007 | DDECS | Layout to Logic Defect Analysis for Hierarchical Test Generation. | Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A. Pleskacz, Michal Rakowski |