Mick Tegethoff
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
11
Venues
1
Active years
1992–2006
Best venue rank
A
Where they publish
Papers
11 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | ITC | OCI: Open Compression Interface. | Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie |
| 2004 | ITC | An Economic Analysis and ROI Model for Nanometer Test. | Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane |
| 2001 | ITC | A new methodology for improved tester utilization. | Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir |
| 1997 | ITC | ASIC Manufacturing Test Cost Prediction at Early Design Stage. | Von-Kyoung Kim, Tom Chen, Mick Tegethoff |
| 1996 | ITC | Issues in Optimizing the Test Process - A Telecom Case Study. | Felix Frayman, Mick Tegethoff, Brenton White |
| 1996 | ITC | ASIC Yield Estimation at Early Design Cycle. | Von-Kyoung Kim, Mick Tegethoff, Tom Chen |
| 1996 | ITC | Opens Board Test Coverage: When is 99% Really 40%? | Mick Tegethoff, Kenneth P. Parker, Ken Lee |
| 1994 | ITC | Defects, Fault Coverage, Yield and Cost in Board Manufacturing. | Mick Tegethoff, Tom Chen |
| 1994 | ITC | Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs. | Mick Tegethoff, Tom Chen |
| 1993 | ITC | IEEE 1149.1: How to Justify Implementation. | Mick Tegethoff |
| 1992 | ITC | Board Test DFT Model for Computer Products. | Mick Tegethoff, T. E. Figal, S. W. Hird |