Mike Farrell
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2007–2007
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ITC | Implementing bead probe technology for in-circuit test: A case study. | Mike Farrell, Glen Leinbach |