Ming-Cheng Chiang
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2009–2009
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ITC | A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design. | Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu |