Mitch Aigner
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1995–1997
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1997 | ITC | Embedded At-Speed Test Probe. | Mitch Aigner |
| 1995 | ITC | Supplying Known-Good Die for MCM Applications Using Low-Cost Embedded Testing. | A. Frisch, Mitch Aigner, T. Almy, Hans J. Greub, Mousumi Mitra Hazra, S. Mohr, Nicholas J. Naclerio, W. Russell, M. Stebniskey |