| 2022 | ASPDAC | DREAMPlaceFPGA: An Open-Source Analytical Placer for Large Scale Heterogeneous FPGAs using Deep-Learning Toolkit. | Rachel Selina Rajarathnam, Mohamed Baker Alawieh, Zixuan Jiang, Mahesh A. Iyer, David Z. Pan |
| 2020 | ASPDAC | High-Definition Routing Congestion Prediction for Large-Scale FPGAs. | Mohamed Baker Alawieh, Wuxi Li, Yibo Lin, Love Singhal, Mahesh A. Iyer, David Z. Pan |
| 2020 | DAC | Wafer Map Defect Patterns Classification using Deep Selective Learning. | Mohamed Baker Alawieh, Duane S. Boning, David Z. Pan |
| 2020 | ICCAD | Re-examining VLSI Manufacturing and Yield through the Lens of Deep Learning : (Invited Talk). | Mohamed Baker Alawieh, Wei Ye, David Z. Pan |
| 2019 | ASPDAC | S | Mohamed Baker Alawieh, Xiyuan Tang, David Z. Pan |
| 2019 | ASPDAC | Tackling signal electromigration with learning-based detection and multistage mitigation. | Wei Ye, Mohamed Baker Alawieh, Yibo Lin, David Z. Pan |
| 2019 | DAC | GAN-SRAF: Sub-Resolution Assist Feature Generation Using Conditional Generative Adversarial Networks. | Mohamed Baker Alawieh, Yibo Lin, Zaiwei Zhang, Meng Li, Qixing Huang, David Z. Pan |
| 2019 | DAC | Rethinking Sparsity in Performance Modeling for Analog and Mixed Circuits using Spike and Slab Models. | Mohamed Baker Alawieh, Sinead A. Williamson, David Z. Pan |
| 2019 | DAC | LithoGAN: End-to-End Lithography Modeling with Generative Adversarial Networks. | Wei Ye, Mohamed Baker Alawieh, Yibo Lin, David Z. Pan |
| 2019 | DATE | Litho-GPA: Gaussian Process Assurance for Lithography Hotspot Detection. | Wei Ye, Mohamed Baker Alawieh, Meng Li, Yibo Lin, David Z. Pan |
| 2018 | ITC | Machine Learning for Yield Learning and Optimization. | Yibo Lin, Mohamed Baker Alawieh, Wei Ye, David Z. Pan |
| 2017 | ICCAD | Efficient programming of reconfigurable radio frequency (RF) systems. | Mohamed Baker Alawieh, Fa Wang, Jun Tao, Shihui Yin, Minhee Jun, Xin Li, Tamal Mukherjee, Rohit Negi |
| 2016 | ICCAD | Efficient statistical validation of machine learning systems for autonomous driving. | Weijing Shi, Mohamed Baker Alawieh, Xin Li, Huafeng Yu, Nikos Archiga, Nobuyuki Tomatsu |
| 2016 | ISCAS | Identifying systematic spatial failure patterns through wafer clustering. | Mohamed Baker Alawieh, Fa Wang, Xin Li |