Mudasir S. Kawoosa
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2018–2018
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2018 | VLSID | Towards Single Pin Scan for Extremely Low Pin Count Test. | Mudasir S. Kawoosa, Rajesh K. Mittal, Maheedhar Jalasuthram, Rubin A. Parekhji |