| 2013 | SMC | Based on Synchronized Timed Petri Nets for Urban Traffic Control Systems. | Yi-Sheng Huang, Yi-Shun Weng, MuDer Jeng, Bo-Yang Chen |
| 2012 | SMC | Using theory of regions with selective siphon control for deadlock prevention policy in Petri nets. | Yen-Liang Pan, Yi-Sheng Huang, MuDer Jeng, Sheng-Luen Chung |
| 2011 | SMC | Telematics gateway and power saving method for electric vehicles. | Po-Lun Chang, Yu-Xin Guo, MuDer Jeng |
| 2011 | SMC | Fault measure of discrete event systems using probabilistic timed automata. | Yi-Sheng Huang, Ho-Shan Chiang, MuDer Jeng |
| 2011 | SMC | An efficient deadlock prevention policy for FMSs using reduction method and theory of regions. | Yen-Liang Pan, Yi-Sheng Huang, MuDer Jeng |
| 2010 | SMC | Modeling and analysis of traffic light controller using Statechart. | Yi-Sheng Huang, Shuo-Xian Liau, MuDer Jeng |
| 2010 | SMC | Enhancement of an deadlock prevention policy for FMSs using theory of regions. | Yi-Sheng Huang, Yen-Liang Pan, MuDer Jeng, Po-Lun Chang |
| 2010 | SMC | A case study of applying regional level-set formulation to post-sawing LED wafer inspection. | ChunHsi Li, Chuan-Yu Chang, MuDer Jeng, Yang-Ting Jeng |
| 2009 | SMC | Automatic Die Inspection for Post-sawing LED Wafers. | Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng |
| 2009 | SMC | A Novel Consumer Clock Device Based on Grey Relational Analysis. | Po-Lun Chang, Ying-Kuei Yang, Wei-Lieh Hsu, Fei-Hu Hsieh, MuDer Jeng, Yu-Xin Guo |
| 2009 | SMC | An Enforcing Supervisor for Flexible Manufacturing Systems Using Theory of Regions. | Yi-Sheng Huang, MuDer Jeng |
| 2008 | SMC | Diagnosable discrete event system design: A case study of automatic temperature control system. | YuanLin Wen, MuDer Jeng |
| 2007 | KES | An Agent-Based Early Manufacturability Assessment for Collaborative Design in Coating Process. | Chii-Ruey Lin, Pei-Shu Fan, Yea-Jou Shiau, MuDer Jeng |
| 2007 | KES | Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines. | YuanLin Wen, Sheng-Luen Chung, Li-Der Jeng, MuDer Jeng |
| 2007 | SMC | Diagnosable discrete event systems design. | YuanLin Wen, Pei-Shu Fan, MuDer Jeng |
| 2006 | KES | An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems. | YuanLin Wen, MuDer Jeng, Li-Der Jeng, Pei-Shu Fan |
| 2006 | SMC | Diagnosability Enhancement of Discrete Event Systems. | YuanLin Wen, ChunHsi Li, MuDer Jeng |
| 2005 | ICRA | An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. | Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng |
| 2005 | SMC | Development of route oriented Petri net for cycle time evaluations in SMT assemblies industries. | Chung-Hsien Kuo, Jein-Jong Wing, Eric Lee, MuDer Jeng |
| 2005 | SMC | A polynomial algorithm for checking diagnosability of Petri nets. | YuanLin Wen, ChunHsi Li, MuDer Jeng |
| 2004 | ICRA | Petri Net Modeling and Lagrangian Relaxation Approach to Vehicle Scheduling in 300 mm Semiconductor Manufacturing. | Da-Yin Liao, MuDer Jeng, MengChu Zhou |
| 2004 | SMC | Using a self-organizing neural network for wafer defect inspection. | Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng |
| 2004 | SMC | Diagnosability of Petri nets. | YuanLin Wen, MuDer Jeng |
| 2003 | ICRA | AN overview of semiconductor fab automation systems. | Sheng-Luen Chung, MuDer Jeng |
| 2003 | ICRA | ERCN merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems. | MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung |
| 2003 | SMC | Failure diagnosis: a case study on modeling and analysis by Petri nets. | Sheng-Luen Chung, Chien-Chung Wu, MuDer Jeng |
| 2003 | SMC | Design and implementation of a discrete event system using statecharts. | Yi-Sheng Huang, Sheng-Luen Chung, MuDer Jeng, Jenn-Huei Lin |
| 2002 | ICRA | Normalized In-Line Stepper Coordinator Design by the Sequence Diagram and Production Rules: A Case Study. | Sheng-Luen Chung, MuDer Jeng |
| 2002 | ICRA | Analysis of a Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems. | Yi-Sheng Huang, MuDer Jeng, YuanLin Wen |
| 2002 | ICRA | Extension of UML and Its Conversion to Petri Nets for Semiconductor Manufacturing Modeling. | MuDer Jeng, Weizhao Lu |
| 2001 | ICRA | A Deadlock Prevention Policy for Flexible Manufacturing Systems Using Siphons. | Yi-Sheng Huang, MuDer Jeng, Xiaolan Xie, Sheng-Luen Chung |
| 2001 | ICRA | Modeling and Analysis of Semiconductor Manufacturing Systems with Degraded Behaviors Using Petri Nets and Siphons. | MuDer Jeng, Xiaolan Xie |
| 2000 | ICRA | Manufacturing Modeling using Process Nets with Resources. | MuDer Jeng, Xiaolan Xie, Yi-Sheng Huang |
| 1998 | SMC | Performance evaluation of the thin film area in an IC wafer fabrication system using Petri nets. | MuDer Jeng, Chi Liang Chuang, WenYuan Hung |
| 1998 | SMC | Deadlock-free scheduling of flexible manufacturing systems based on heuristic search and Petri net structures. | MuDer Jeng, Wan Der Chiou, YuanLin Wen |
| 1998 | SMC | Qualitative analysis and deadlock prevention of a real-world IC wafer fabrication system. | MuDer Jeng, Xiaolan Xie |
| 1998 | SMC | Modeling and performance analysis of semiconductor manufacturing systems. | MuDer Jeng, Xiaolan Xie |
| 1998 | SMC | Modeling and analysis using Petri nets for semiconductor fabrication. | MuDer Jeng, Xiaolan Xie |
| 1998 | SMC | Synthesis of extended resource control nets using siphons. | MuDer Jeng, Xiaolan Xie |
| 1995 | ICRA | A Neural Network Model for the Job-Shop Sheduling Problem with the Consideration of Lots Sizes. | Chuan-Yu Chang, MuDer Jeng |