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Muthu Kumaran Nambi

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2025–2025

Best venue rank

B

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2025ETSOptimized MBIST-Based MRAM Testing for Automotive MCUs to Achieve Superior Performance and Quality Assurance.Vinayak Bharat Naik, Gregory Billus, Amit Kumar Shukla, Andre Vogel, Veit Kriegerstein, Patrick Scharf, Venkata Siva Komma, Johannes Mueller, Thomas Merbeth, Ralf Flemming, Ingolf Lorenz, Muthu Kumaran Nambi, Ee Ee Yeoh, Hemavathi Chaya, Siddharth Gupta, Yentsai Huang, Sushma Sambatur, Joerg Winkler, Tom Andre, Shane Hollmer, Steven Soss, Jongsin Yun, Wei Zou, Harshitha Kodali, Luc Romain, Albert Au, Lori Schramm, Martin Keim