N. Okino
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1985–1985
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1985 | ITC | Memory Embedded VLSI Gate Array Testing. | M. Shimizu, N. Okino, J. Nishiura, H. Maruyama |