Naresh K. Bhatti
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2006–2008
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | DATE | Physically-Aware N-Detect Test Pattern Selection. | Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton |
| 2006 | ITC | Diagnostic Test Generation for Arbitrary Faults. | Naresh K. Bhatti, Ronald D. Blanton |