Narumi Sakashita
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
2
Active years
1990–1997
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1997 | ICONIP | Reduction of the Test Time for Mass Produced LSI Devices by Genetic Algorithms. | T. Iwamoto, S. Kobashi, Narumi Sakashita, J. Mitsuishi, Ken-ichi Tanaka, Kazuo Kyuma |
| 1996 | ITC | A Built-In Self-Test Circuit with Timing Margin Test Function in a 1Gbit Synchronous DRAM. | Narumi Sakashita, Fumihiro Okuda, Ken'ichi Shimomura, Hiroki Shimano, Mitsuhiro Hamada, Tetsuo Tada, Shinji Komori, Kazuo Kyuma, Akihiko Yasuoka, Haruhiko Abe |
| 1993 | ITC | A Built-in Self- Test for ADC and DAC in a Single-Chip Speech CODEC. | Eiichi Teraoka, Toru Kengaku, Ikuo Yasui, Kazuyuki Ishikawa, Takahiro Matsuo, Hideyuki Wakada, Narumi Sakashita, Yukihiko Shimazu, Takeshi Tokuda |
| 1990 | ITC | Built-in self-test in a 24 bit floating point digital signal processor. | Narumi Sakashita, Hisako Sawai, Eiichi Teraoka, Toshiki Fugiyama, Toru Kengaku, Yukihiko Shimazu, Takeshi Tokuda |