Neha Goel
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2016–2016
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ITC | A novel diagnostic test generation methodology and its application in production failure isolation. | M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma |