Neil G. Jacobson
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
2000–2008
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | ITC | Boundary-Scan Testing of Power/Ground Pins. | Kenneth P. Parker, Neil G. Jacobson |
| 2004 | DATE | Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. | Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts |
| 2000 | ITC | Streamlining programmable device and system test using IEEE Std 1532. | Neil G. Jacobson |