Ovidio V. Maiuri
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1998–1998
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | VTS | Implications of Voltage and Dimension Scaling on CMOS Testing: The Multidimensional Testing Paradigm. | Ovidio V. Maiuri, Will R. Moore |