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P. Kuekes

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1996–1996

Best venue rank

National

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1996VTSCan Defect-Tolerant Chips Better Meet the Quality Challenge?R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu