Paul J. van Wijnen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1998–1998
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. | Ivo Schanstra, Dharmajaya Lukita, Ad J. van de Goor, Kees Veelenturf, Paul J. van Wijnen |