Pei-Yin Wu
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2023–2023
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2023 | VTS | Test Generation for Defect-Based Faults of Scan Flip-Flops. | Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao |