Peter Nagel
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1991–1991
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1991 | ITC | An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. | Klaus Helmreich, Peter Nagel, Werner Wolz, Klaus D. Mller-Glaser |