Phil Shephard III
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2000–2000
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | VTS | Silicon-on-Insulator Technology Impacts on SRAM Testing. | R. Dean Adams, Phil Shephard III |