Phillip Fynan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2016–2017
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ITC | Front-end layout reflection for test chip design. | Zeye Liu, Phillip Fynan, Ronald D. Blanton |
| 2016 | ITC | Logic characterization vehicle design reflection via layout rewiring. | Phillip Fynan, Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton |