Prabhakar Goel
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
3
Active years
1980–1986
Best venue rank
A*
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1986 | ICPP | Application of Parallel Processing to Fault Simulation. | Prabhakar Goel, Chi-Lai Huang, Robert E. Blauth |
| 1985 | ITC | Statistical Fault Sampling and Full Fault Simulation. | Prabhakar Goel, Chi-Lai Huang |
| 1984 | ITC | Testability Analysis will not Replace Fault Simulation. | Prabhakar Goel |
| 1982 | DAC | Electronic Chip-in-Place Test. | Prabhakar Goel, M. T. McMahon |
| 1982 | ITC | A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. | Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams |
| 1982 | ITC | Electronic Chip-In-Place Test. | Prabhakar Goel, M. T. McMahon |
| 1981 | DAC | PODEM-X: An automatic test generation system for VLSI logic structures. | Prabhakar Goel, Barry C. Rosales |
| 1980 | DAC | Test generation costs analysis and projections. | Prabhakar Goel |