R. Cagliesi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2008–2009
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ETS | Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso, Edgar E. Snchez, Matteo Sonza Reorda |
| 2008 | ETS | An Innovative and Low-Cost Industrial Flow for Reliability Characterization of SoCs. | Davide Appello, Paolo Bernardi, R. Cagliesi, M. Giancarlini, Michelangelo Grosso |