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R. de Vries

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

2

Active years

1997–1998

Best venue rank

National

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
1998VTSDecreasing the Sensitivity of ADC Test Parameters by Means of Wobbling.R. de Vries, Augustus J. E. M. Janssen
1997DATEBuilt-in self-test methodology for A/D converters.R. de Vries, Taco Zwemstra, E. M. J. G. Bruls, Paul P. L. Regtien