R. Khurana
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2013–2013
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2013 | ITC | SmartScan - Hierarchical test compression for pin-limited low power designs. | Krishna Chakravadhanula, Vivek Chickermane, Don Pearl, Akhil Garg, R. Khurana, Subhasish Mukherjee, P. Nagaraj |