R. Malneedi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2010–2010
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ITC | Low cost at-speed testing using On-Product Clock Generation compatible with test compression. | Brion L. Keller, Krishna Chakravadhanula, Brian Foutz, Vivek Chickermane, R. Malneedi, Thomas J. Snethen, Vikram Iyengar, David E. Lackey, Gary Grise |