R. T. Venkatesh
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2011–2011
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2011 | VTS | An efficient test data reduction technique through dynamic pattern mixing across multiple fault models. | Srinivasulu Alampally, R. T. Venkatesh, Priyadharshini Shanmugasundaram, Rubin A. Parekhji, Vishwani D. Agrawal |